Scanning electron beam computed tomography scanner with ion aided focusing
US4521901A · kind A · utility
39Cited by
2References
22Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 1, 1983 |
| Grant date | Jun 4, 1985 |
| Priority date | — |
| Expiry date | Mar 1, 2003 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH01J35/147
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
An electron beam production and control assembly especially suitable for use in producing X-rays in a computed tomography X-ray scanning system is disclosed herein. In this system, an electron beam is ultimately directed onto an X-ray producing target in a converging manner using electromagnetic components to accomplish this. The system also includes an arrangement for neutralizing the converging beam in a controlled manner sufficient to cause it to converge to a greater extent than it otherwise would in the absence of controlled neutralization, whereby to provide ion aided focusing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.