Radiation scatter apparatus and method
US4525854A · kind A · utility
98Cited by
6References
18Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Mar 22, 1983 |
| Grant date | Jun 25, 1985 |
| Priority date | — |
| Expiry date | Mar 22, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B15/02
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A radiation scatter gauge includes multiple detector locations for developing separate and independent sets of data from which multiple physical characteristics of a thin material and underlying substrate may be determined. In an illustrated embodiment, the apparatus and method of the invention are directed to determining characteristics of resurfaced pavement by nondestructive testing. More particularly, the density and thickness of a thin asphalt overlay and the density of the underlying pavement may be determined.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.