Patent · US Expired

AC parametric circuit having adjustable delay lock loop

US4527126A · kind A · utility

29Cited by
10References
16Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 26, 1983
Grant dateJul 2, 1985
Priority date
Expiry dateAug 26, 2003

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG04F10/10
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

An improved delay lock loop which has first and second means (32, 34) for generating a voltage ramp, the first ramp generator (32) providing a train of ramped inputs to first time delay means (38) responsive to a first input pulse train and the second ramp generator (34) providing a train of ramped inputs to a second time delay means (40) responsive to a second input pulse train. The ramp generators (32, 34) provide a highly linear voltage ramp. First and second retrace means (36A, 36B) are connected to the first and second ramp generators (32, 34) respectively and act to limit the ramps to a certain voltage, commanding the ramp generators (32, 34) to return to a reference voltage to await the succeeding input pulse edge transition. A further improvement comprises range switch means (44) that function to selectively control the maximum range of time delay which the delay lock loop is able to sense. This permits selecting a greater or lesser range of time which the delay in time intervals between the edge transitions of the pulses in the first and second input pulse in the first and second input pulse trains can have and still be measured. Additionally, calibrator means (26) are inc…

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.