Patent · US Expired

Examining a gemstone

US4529305A · kind A · utility

22Cited by
2References
21Claims
0Family size

Inventors

Key dates

Filing dateJul 6, 1982
Grant dateJul 16, 1985
Priority date
Expiry dateJul 6, 2002

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N21/87
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

Method and apparatus for examining a gemstone to determine a parameter thereof. A thin beam of light is projected onto the stone, the beam is moved relative to the stone, the position where the beam strikes the stone is sensed in a direction different from that in which the beam is projected, and a parameter is determined making use of information derived from such sensing.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.