Examining a gemstone
US4529305A · kind A · utility
22Cited by
2References
21Claims
0Family size
Inventors
Key dates
| Filing date | Jul 6, 1982 |
| Grant date | Jul 16, 1985 |
| Priority date | — |
| Expiry date | Jul 6, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/87
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Method and apparatus for examining a gemstone to determine a parameter thereof. A thin beam of light is projected onto the stone, the beam is moved relative to the stone, the position where the beam strikes the stone is sensed in a direction different from that in which the beam is projected, and a parameter is determined making use of information derived from such sensing.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.