Method of emission spectroanalysis
US4531836A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 8, 1983 |
| Grant date | Jul 30, 1985 |
| Priority date | — |
| Expiry date | Mar 8, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01J2003/2866
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectroanalytical method includes the steps of exciting material to spectroemissive levels, dispersing radiation from the excited sample material into a spectrum, positionally locating a reference constituent of the excited material in the spectrum, the reference constituent having a known wavelength offset from an element of interest in the sample material to be analyzed, and then shifting the known wavelength offset by an essentially hysteresis free mechanism and making an analytical measurement at that wavelength offset position of radiation produced by a spectrum from sample material that has been excited to spectroemissive levels.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.