Pressure measuring systems with increased accuracy for a constant resolution
US4532809A · kind A · utility
8Cited by
6References
24Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 5, 1981 |
| Grant date | Aug 6, 1985 |
| Priority date | — |
| Expiry date | Oct 5, 2001 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01P5/175
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A pressure parameter measurement system includes a parameter measurement loop (24, 16, 26, 28, 30, 32, 34) generating a digital signal (N1) indicative of a parameter (Pa-Pb) being measured, a common mode measurement loop (24, 22, 36, 38, 40, 42, Cfa) generating a digital signal (N2) indicative of an element (Pa) of the parameter (Pa-Pb), and a calibration circuit (46) which outputs the parameter (Pa-Pb) as a function of the digital signals (N1, N2) and a temperature signal T.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.