Process and device for the analysis of the heterogeneous features in a transparent material
US4541856A · kind A · utility
8Cited by
4References
20Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Nov 25, 1983 |
| Grant date | Sep 17, 1985 |
| Priority date | — |
| Expiry date | Nov 25, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2021/4735
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
The invention relates to the analysis of defects in materials such as molten glass. According to the invention, the material passes by a monochrome beam the wavelength of which is below 3.times.10.sup.-6 m. The radiation is diffused by any defects present in the material. The analysis of the defects is conducted dependent on the position of the receiver detecting the diffused rays and on the shape of the signal received. The invention permits a continuous analysis of a flow of glass supplying a fiber-making machine.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.