Method of manufacturing a moisture sensor
US4541904A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 9, 1983 |
| Grant date | Sep 17, 1985 |
| Priority date | — |
| Expiry date | Nov 9, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/225
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A moisture sensor is manufactured by applying a thin layer of tantalum oxide to a moisture insensitive substrate and placing at least two electrodes on the tantalum oxide layer. The tantalum oxide layer comprises the oxide of a highly resistive low density tantalum where the tantalum in the layer applied to the substrate has a density of less than 15 g/cm.sup.3. The low density tantalum may be applied by cathode sputtering and the oxide may be formed by anodic oxidation.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.