Patent · US Expired

Method of manufacturing a moisture sensor

US4541904A · kind A · utility

11Cited by
3References
40Claims
0Family size

Assignee

Inventors

Key dates

Filing dateNov 9, 1983
Grant dateSep 17, 1985
Priority date
Expiry dateNov 9, 2003

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/225
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A moisture sensor is manufactured by applying a thin layer of tantalum oxide to a moisture insensitive substrate and placing at least two electrodes on the tantalum oxide layer. The tantalum oxide layer comprises the oxide of a highly resistive low density tantalum where the tantalum in the layer applied to the substrate has a density of less than 15 g/cm.sup.3. The low density tantalum may be applied by cathode sputtering and the oxide may be formed by anodic oxidation.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.