Patent · US Expired

Spectrometer with selectable area detector

US4542295A · kind A · utility

14Cited by
4References
20Claims
0Family size

Inventors

Key dates

Filing dateSep 29, 1983
Grant dateSep 17, 1985
Priority date
Expiry dateSep 29, 2003

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY02E10/50
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A Fourier transform infrared spectrometer utilizes a selectable area infrared detector to optimize performance of the instrument depending upon the nature of the sample being analyzed. The detector includes an inner detecting segment and one or more outer detecting segments which extend at least partially around the inner segment and are electrically isolated therefrom. In those cases where a small area detector provides optimal sensitivity and performance, only the inner detecting segment is enabled to contribute to the output of the detector. In those cases where a larger area detector provides optimal sensitivity and performance, one or more of the outer detecting segments are enabled to contribute to the output of the detector, either alone or in combination with the inner segment. Thus, a single detector in the instrument provides optimal sensitivity and performance for a wide range of applications.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.