Testing of structures by impact
US4542639A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 2, 1984 |
| Grant date | Sep 24, 1985 |
| Priority date | — |
| Expiry date | Apr 2, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2203/005
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus and method for testing structures by impact. The structure is struck by an impactor associated with a force transducer the output of which is related to the force which the transducer experiences on impact and encompasses a frequency range including the lowest frequencies (typically approaching zero frequency, see FIG. 3) which that force contains to any substantial degree. A test spectrum of the force including that full range of frequencies is produced by a Fourier transformer in a form suitable for automatic comparison, and is then so compared with a reference spectrum typical of impact with a reference structure, and a signal is produced indicating fit or lack of fit between the test and reference spectra.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.