Patent · US Expired

Coin testing apparatus

US4546869A · kind A · utility

20Cited by
3References
25Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 8, 1983
Grant dateOct 15, 1985
Priority date
Expiry dateFeb 8, 2003

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG07D5/00
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

The operation of a coin testing apparatus is checked by switching the apparatus to a test mode. In the test mode, the properties of items inserted into the apparatus are compared with stored "test" ranges, instead of "acceptability" ranges which are normally used to determine whether the item is a genuine coin. A specially designed non-genuine coin is then inserted into the apparatus. If the measured properties of the non-genuine coin fall within the "test" ranges, a signal is produced to indicate that the apparatus is operating correctly. If any of the properties falls outside a "test" range, but within a further, contiguous range, a signal indicates that the apparatus is working adequately, but not optimally.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.