Patent · US Expired

Two-dimensional semiconductor image sensor and method of operating the same

US4547806A · kind A · utility

12Cited by

1References

8Claims

0Family size

Assignee

Siemens Aktiengesellschaft · DE

Inventors

Heiner Herbst · Haar, DE
Rudolf Koch · Oberhaching, DE

Key dates

Filing date	Jul 8, 1983
Grant date	Oct 15, 1985
Priority date	—
Expiry date	Jul 8, 2003

Classification

Technology area (CPC H)Electricity
CPC primaryH04N25/621
WIPO fieldAudio-visual technology
WIPO sectorElectrical engineering

Abstract

A two-dimensional semiconductor image sensor has row lines which are selectable by way of a vertical shift register to drive first selection transistors of row and column oriented sensor elements. Column lines are connected to a read-out line by way of switches which are sequentially driven by outputs of a horizontal shift register. The goal is to increase the signal-to-noise ratio and is achieved by the provision of second selection transistors for the sensor elements which are connected in series with the first selection transistors, by way of row selection transistors which connect the row lines to the outputs of the vertical shift register, and by way of a difference-forming stage which is connected to the read-out line.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.