Moisture probe and technique
US4549134A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 7, 1984 |
| Grant date | Oct 22, 1985 |
| Priority date | — |
| Expiry date | Sep 7, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/223
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A superior moisture probe and technique for assaying liquid and gas streams for moisture concentration in the parts per million (ppm) range, comprises an emf source connected across a pair of adjacent conductive probes separated by a sulfonated aliphatic fluorocarbon membrane, the combination being immersed in the fluid of interest, or in a sealed headspace associated therewith, the former being the preferred mode. With a D.C. emf, the resistance change of the probe, or a value proportional therewith is monitored, and from that value H.sub.2 O concentration is deduced. With an A.C. emf, capacitance, A.C. resistance, and/or impedance of the described probe structure varies proportionately with the concentration of H.sub.2 O in the membrane, and is monitored directly or indirectly to deduce H.sub.2 O concentration. In the latter form of the invention, the conductive components of the probe are desirably clad by a corrosion resistant, impermeable polymeric coating, and in such form, the use of expensive noble metal components for the probe is less critical, and substitution with less expensive conductive materials is thus practical for certain applications.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.