Patent · US Expired

Semiconductor interferometer

US4550330A · kind A · utility

17Cited by
4References
9Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJun 29, 1984
Grant dateOct 29, 1985
Priority date
Expiry dateJun 29, 2004

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10D48/383
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

An interferometer is constructed by providing a bifurcated branch conductive path coplanar with a heterojunction in a semiconductor with a band discontinuity that produces a potential well so that electron wave conduction at the heterojunction can be locally influence with an electric field applied to one branch of the bifurcated path.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.