Modular test probe
US4554506A · kind A · utility
22Cited by
6References
9Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 10, 1984 |
| Grant date | Nov 19, 1985 |
| Priority date | — |
| Expiry date | Dec 10, 2004 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S439/912
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test probe employing a buckling beam array for testing integrated circuits. A pair of identical sets of guides are positioned on either side of a centerpost to align the buckling beams. In one embodiment the holes in one set of guides is offset by a key to induce prebow in the beams. In another embodiment prebow is induced by a floating asymmetric separator positioned on the centerpost between the guide sets. When a force is applied to the probe, the beams deflect in the direction but to different extents so that a uniform force is applied to the surface of the IC irrespective of variations in height.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.