Patent · US Expired

Focused ion beam column

US4556798A · kind A · utility

25Cited by
5References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 12, 1983
Grant dateDec 3, 1985
Priority date
Expiry dateJul 12, 2003

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH01J37/3007
  • WIPO fieldElectrical machinery, apparatus, energy
  • WIPO sectorElectrical engineering

Abstract

Two lens focused ion beam column (10) has an accelerating lens (20) which carries a potential to focus an image of the liquid metal ion source (14) on the mass analyzer slit (26) with a magnification of about unity. Munro lens (36) accelerates the beam of selected ion species and demagnifies the image through a long working distance to provide an ion writing spot of less than about 1000 .ANG. size.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.