Patent · US Expired

Bi-directional switching circuit

US4556947A · kind A · utility

6Cited by
3References
10Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 23, 1982
Grant dateDec 3, 1985
Priority date
Expiry dateAug 23, 2002

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01R31/3191
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A bidirectional switching circuit is provided for testing a large number of AC data paths of LSI macrocell arrays. The circuit includes a plurality of bidirectional pins, a first logic means, and a second logic means. The switching circuit may be used to deskew a general purpose LSI tester wherein any pin may be used for input or output and the pulse at any pin may be inverted. The second logic means, receiving signals on selected pins, initializes the first logic means thereby determining which pins may be used for testing the data path desired.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.