System to measure geometric and electromagnetic characteristics of objects
US4557386A · kind A · utility
50Cited by
10References
35Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 27, 1983 |
| Grant date | Dec 10, 1985 |
| Priority date | — |
| Expiry date | Jun 27, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2291/2698
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A system to measure geometric and electromagnetic characteristics of objects. Wave energy of a single frequency (or very narrow band of frequencies) is directed upon an object which reflects (or otherwise interacts with) the wave energy. The reflected wave energy is sensed by many spatially spaced sensors to provide electric signals whose amplitude and phase components are combined to give a quantity from which geometric and/or electromagnetic characteristics of the object can be ascertained.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.