Pattern reading system
US4566124A · kind A · utility
44Cited by
4References
4Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Aug 10, 1983 |
| Grant date | Jan 21, 1986 |
| Priority date | — |
| Expiry date | Aug 10, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06V30/10
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A pattern reading system by line segment approximation comprising the steps of tracing the contour and simultaneously, seeking out as candidate extreme points the points at which the inner products of coordinate point vectors and directional vectors at coordinate points of the contour being traced are largest, and feeding out these candidate extreme points as real extreme points when the differences between the inner products of the direction vectors and the inner products of the candidate extreme points are greater than an allowance set in advance.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.