Magnetic thickness gauge with adjustable probe
US4567436A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Jan 21, 1982 |
| Grant date | Jan 28, 1986 |
| Priority date | — |
| Expiry date | Jan 21, 2002 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S33/01
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A magnetic thickness gauge is disclosed wherein a balance arm is pivotably mounted in a housing with a spring providing a bias force to counteract a magnetic attraction of the balance arm toward a base of a coating to be measured. The balance arm is provided with a probe assembly including a magnet selectively positionable with respect to a spherical contact member of either a particular alloy of aluminum, iron and silicon or of tungsten carbide. The housing is preferably provided with supports at either end of the gauge. A balance arm is moved by way of a protrusion provided between the probe assembly and an adjustment knob for the spring with a scale and pointer indicating the thickness of the coating to be measured.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.