Patent · US Expired

Electrical contact probe

US4571540A · kind A · utility

18Cited by

2References

7Claims

0Family size

Assignee

Virginia Panel Corporation · US

Inventors

Jeffery P. Stowers · Mount Sidney, US
Thomas W. Moore · Lakeland, US

Key dates

Filing date	Sep 14, 1983
Grant date	Feb 18, 1986
Priority date	—
Expiry date	Sep 14, 2003

Classification

Technology area (CPC G)Physics
CPC primaryG01R3/00
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

An electrical contact probe is produced by four passes of a profiled machining cutter across the longitudinal axis of the probe at circumferentially equidistantly spaced points and with the machining cutter on each pass traveling on a linear path disposed at an acute angle to the longitudinal axis of the probe. The contact probe so produced has a long pyramid center point surrounded concentrically by eight modified pyramid points in two levels or heights. The shortest level points are arranged in alternating relation with the other points surrounding the center point and all of the surrounding points are of lesser height than the center point.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.