Patent · US Expired

Resin encapsulation type semiconductor device

US4572853A · kind A · utility

15Cited by
4References
12Claims
0Family size

Assignee

Inventors

Key dates

Filing dateFeb 21, 1984
Grant dateFeb 25, 1986
Priority date
Expiry dateFeb 21, 2004

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10T428/31942
  • WIPO fieldMacromolecular chemistry, polymers
  • WIPO sectorChemistry

Abstract

There is presented a highly reliable resin encapsulation type semiconductor device excellent in humidity resistance as well as high temperature electrical characteristics. The specific feature consists in the epoxy resin composition employed for encapsulation. This composition comprises an epoxy resin, a novolac resin as curing agent and an organic tertiary phosphine compound as curing accelerator. The resin encapsulation type semiconductor device is markedly small in leak current under hot and humid conditions and has a prolonged life due to difficult deterioration through corrosion of electrodes and aluminum wiring, as compared with those of prior art.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.