Patent · US Expired

Method and apparatus for testing electro-mechanical devices

US4573011A · kind A · utility

6Cited by
8References
29Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMay 20, 1983
Grant dateFeb 25, 1986
Priority date
Expiry dateMay 20, 2003

Classification

  • Technology area (CPC Y)Emerging Cross-Sectional Technologies
  • CPC primaryY10S198/952
  • WIPO fieldChemical engineering
  • WIPO sectorChemistry

Abstract

A method and apparatus are disclosed for testing devices of the type having elongated flexible appendages (12, 14; 16, 18) at which test signals or responses must be applied or received. An elongated flexible carrier (40) is provided with a plurality of fixtures (44) for supporting such devices so that the free ends (14, 18) of their appendages are positioned conveniently for testing. The carrier is wound to and from large reels (124, 126) and passes through a multiple probe station (186) where each device is tested.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.