Patent · US Expired

Method for measuring surface and near surface properties of materials

US4574637A · kind A · utility

17Cited by

4References

10Claims

0Family size

Inventors

Laszlo Adler · Knoxville, US
Dale W. Fitting · Ann Arbor, US
Michel de Billy · Paris, FR

Key dates

Filing date	Aug 3, 1984
Grant date	Mar 11, 1986
Priority date	—
Expiry date	Aug 3, 2004

Classification

Technology area (CPC G)Physics
CPC primaryG01N2291/101
WIPO fieldMeasurement
WIPO sectorInstruments

Abstract

The properties of the surface layer of a material are measured by a technique which employs the transmission of ultrasonic waves from varying angles of incidence into a specimen, from a transducer at a point spaced from the specimen. The backscattered waves are detected and evaluated from the varying angles to detect the local maximum intensity, from which the corresponding properties of the material are determined.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.