Patent · US Expired

Electrically alterable non-volatile memory

US4575823A · kind A · utility

12Cited by
7References
21Claims
0Family size

Assignee

Inventor

Key dates

Filing dateAug 17, 1982
Grant dateMar 11, 1986
Priority date
Expiry dateAug 17, 2002

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG11C16/12
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A non-volatile memory and method is described incorporating an array of variable threshold transistors, a row decoder, a buffer circuit positioned between the array and row decode circuitry, column decode circuitry, and a sense amplifier. The non-volatile memory overcomes the problem of high voltages in the memory array during READ operation. During READ operation the variable threshold transistors operate in the common source mode. A buffer circuit with level shift capability is described incorporating P and N channel transistors. A sense amplifier with decoupling during sensing or lock out is described incorporating P and N channel transistors.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.