X-Ray fluorescence spectrometer and method of calibrating the same
US4577338A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Nov 1, 1982 |
| Grant date | Mar 18, 1986 |
| Priority date | — |
| Expiry date | Nov 1, 2002 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N2223/076
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
X-ray fluorescence spectrometer for determining the sulfur content of oil and other matrices, and method of calibrating the same. The spectrometer comprises a pulse height analyzer and a computer for analyzing the energy spectrum of photons emitted by a sample in regions corresponding to the energy levels of photons emitted by sulfur and the target line x-rays scattered by the sample. The windows through which the energy is sampled are adjusted to provide a calibration curve of predetermined shape, and a built-in standard is analyzed and a value corresponding to the ratio of the relative intensities of the fluorescent energy from the standard and the scattered target line x-ray radiation is stored during initial calibration of the system. Thereafter, the system is recalibrated simply by analyzing the build-in standard again, adjusting the sampling windows, and adjusting a constant in the relationship by which the sulfur content is determined to compensate for drift in the system.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.