Multi-layered thin film heat transfer gauge
US4577976A · kind A · utility
40Cited by
3References
2Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Oct 19, 1984 |
| Grant date | Mar 25, 1986 |
| Priority date | — |
| Expiry date | Oct 19, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N25/18
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A pair of metallic thin films are attached to opposite surfaces of a heat resistive thin film, and the heat flux through the heat resistive thin film is determined by measuring the temperature gradient therein while using the metallic thin films as resistance thermometer elements.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.