Selective parametric self-calibrating control system
US4578747A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Oct 14, 1983 |
| Grant date | Mar 25, 1986 |
| Priority date | — |
| Expiry date | Oct 14, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG05B13/04
- WIPO fieldControl
- WIPO sectorInstruments
Abstract
A controlled system (10) has a control means (12) supplying a manipulated input, Y, to a plant (14). The control means (12) has external inputs V, input control model parameters C, and a predetermined mathematical model to compute a desired controlled system output X.sub.D into Y as a function of V and C. The method for operating the controlled system (10) includes establishing an initial value for C, measuring V, and generating an initial model for generating Y from X.sub.D as a function of V and C. The method also includes correcting C as a function of the difference between X.sub.D and the actual controlled system output, X, and as a function of measured external inputs V.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.