X-ray system tester
US4578767A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Oct 2, 1981 |
| Grant date | Mar 25, 1986 |
| Priority date | — |
| Expiry date | Oct 2, 2001 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/265
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
An X-ray system tester for measuring a set of electrical signals comprising anode voltage, cathode voltage, anode current, filament current and line voltage produced by an X-ray system during the operation of such system. A selector is provided, which couples one of the electrical signals of the sets thereof produced or one of a plurality of processing control signals entered by an operator from a control panel, to a digitizing section, selectively in accordance with control signals provided to the selector by a computing section. The digitizing section converts the selected signal whether produced by the X-ray system or entered from the control panel, into a train of pulses having a frequency proportional to the value of the selected signal. The pulses in the pulse train are counted by a counter. The number of counts being used by the computing section to determine the frequency, and hence, the value of the selected signal. This computed value is stored in a computing memory section and the computing section which there selects a different one of the electrical signals for processing. The computing section is also adapted to store a plurality of the sets of electrical signals prod…
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.