Logic circuit test system
US4583041A · kind A · utility
10Cited by
2References
9Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | May 31, 1984 |
| Grant date | Apr 15, 1986 |
| Priority date | — |
| Expiry date | May 31, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R31/31908
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test system for simultaneously testing a plurality of logic circuits first sets them all to an initial state before beginning testing. The faulty logic circuits which cannot be set to the initial state can be identified, and the testing of the others can proceed, even after only one cycle of attempting to initialize all the logic circuits. If all the logic circuits are faulty, the further testing can be prevented.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.