Method of and apparatus for determining the position of a device relative to a reference
US4585349A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Sep 12, 1984 |
| Grant date | Apr 29, 1986 |
| Priority date | — |
| Expiry date | Sep 12, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B2210/50
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A method of and an apparatus for determining the location or position of a surface element with respect to a reference which utilizes polychromatic light and with a holographic lens on the light focuses individual wavelengths thereof to respective focal points at one of which the surface element can be located. Light reflected from this surface element is then decomposed into the respective wavelengths and the intensities of these wavelengths are analyzed to determine the wavelength of greatest intensity, this being the wavelength whose focus corresponds to the focus of the surface element. The maximum intensity wavelength is used to determine the position of this focus and hence the position of the surface element with respect to a reference.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.