Thermal wave imaging apparatus
US4589783A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 4, 1984 |
| Grant date | May 20, 1986 |
| Priority date | — |
| Expiry date | Apr 4, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N21/171
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A thermal wave imaging apparatus generates a real time image of the surface and subsurface of an opaque solid object. A.C. electrical signals indicative of the configuration of the surface and subsurface of the object which are generated during a thermal wave scan of the object by a first heating beam which generates a localized temperature gradient on the object and a deflectable second probe beam heating beam, which deflection is detected by a detection device mounted adjacent to the object, are stored in an image memory under the control of a central processor. A refresh counter generates sequential, incremental signals used to control the X and Y axis deflection of a display monitor. Such signals also address the image memory and generate output data controlling the intensity of the display point at each generated X and Y axis deflection point. A modulation and intensity regulation circuit generates an optical beam having a constant amplitude in spite of any fluctuations in the output of the heating laser.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.