Short detector for PROMS
US4595875A · kind A · utility
23Cited by
4References
13Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Dec 22, 1983 |
| Grant date | Jun 17, 1986 |
| Priority date | — |
| Expiry date | Dec 22, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG11C2029/5006
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
Test circuitry is included in a PROM memory for detecting shorts between bit lines and word lines and shorts or leaks in a memory cell. The circuitry enables a selected positive voltage to be applied across all memory cells in the memory so that the existance of leaky memory cells or shorts in the memory can be detected during testing. The test circuitry has no appreciable effect on the memory during normal operation of the memory.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.