Systems and methods for translating radiation intensity into pixel values
US4595949A · kind A · utility
13Cited by
6References
48Claims
0Family size
Inventors
Key dates
| Filing date | May 29, 1984 |
| Grant date | Jun 17, 1986 |
| Priority date | — |
| Expiry date | May 29, 2004 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05G1/60
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
Improved diagnostic imaging methods and systems for automatically controlling variable parameters used when translating detected radiation intensities caused by radiation that has passed through an object and impinged on a detector to fixed values for display images by determining the maximum and minimum intensities at the impinged on detector locations and adjusting the parameters as functions of the said maximum and minimum intensities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.