Position measuring method and apparatus
US4595991A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Sep 21, 1983 |
| Grant date | Jun 17, 1986 |
| Priority date | — |
| Expiry date | Sep 21, 2003 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH03M1/30
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A process and apparatus for obtaining harmonic-free periodic signals in an incremental measuring system is disclosed in which a graduation having a graduation period P is scanned by at least six scanning elements (for the case in which the previously determined bandwidth N of the analog signals obtained in scanning the graduation N is equal to 3). The periodic analog signals generated by the scanning elements are subjected to a Fourier analysis for the determination of the Fourier coefficients of the base or fundamental wave of the periodic analog signals. These Fourier coefficients are then evaluated as harmonic-free periodic signals for the formation of position measuring values.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.