Patent · US Expired

Measuring system comprising ion-selective electrodes

US4596649A · kind A · utility

4Cited by
8References
19Claims
0Family size

Assignee

Inventors

Key dates

Filing dateMar 15, 1985
Grant dateJun 24, 1986
Priority date
Expiry dateMar 15, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N27/403
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A measuring system comprises ion-selective electrodes adjoining a measuring passage, which has an inlet and an outlet. The measuring passage has bends, which are adjoined by the sensing electrodes, which are flush with the boundary surface of that measuring passage. Said bends extend also before and behind each electrode. The sensing electrodes are provided at the outside surface of each bend so that they will be effectively rinsed and errors due to entrained impurities will be avoided. The measuring passage is suitably substantially circular but has entrance and exit portions offset from the circular line. The electrodes are provided on the outside particularly in a star-shaped array. The measuring system is provided with a shield consisting of a closed, electrically conducting covering, which preferably consists of a metallic cover. Contact and contact pressure springs are subjected to a uniform stress because the cover is mounted with play by means of a hinge so that self-alignment will be effected.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.