Apparatus for scanning a material for detection of flaws and having material axis deviation detection
US4596953A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Apr 14, 1983 |
| Grant date | Jun 24, 1986 |
| Priority date | — |
| Expiry date | Apr 14, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01N27/9013
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Apparatus for detecting flaws on the circumference of a rounded bar of metal. A circular rotator means held by a support is rotated around the material to be inspected for flaws. The rotator means has a number of probes which are revolved around the circumference of the material to detect flaws when the rotator means is rotated. If and when the material deviates from its axis predetermined through the apparatus while passing therethrough, the deviation is detected and the support is displaced in the same direction and distance as the material so that the probes remain spaced apart from the circumference of the material at a predetermined distance while inspecting the material for flaws.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.