Radiative opacity and emissivity measuring device
US4597933A · kind A · utility
2Cited by
10References
56Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 1, 1983 |
| Grant date | Jul 1, 1986 |
| Priority date | — |
| Expiry date | Jun 1, 2003 |
Classification
- Technology area (CPC H)Electricity
- CPC primaryH05H1/0012
- WIPO fieldChemical engineering
- WIPO sectorChemistry
Abstract
An apparatus for measuring the emissivity and opacity coefficients of a test plasma. The apparatus includes a target comprising a support structure of a carrier material with an asymmetrical sample of a test material disposed thereon, a driver for ionizing the test material into a test plasma and the carrier material into a carrier plasma, and spectrographs for measuring the intensity of photons traversing said test plasma. Embodiments including a separate photon source are also disclosed.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.