Spectrum analyzer and analysis method for measuring power and wavelength of electromagnetic radiation
US4598247A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 24, 1984 |
| Grant date | Jul 1, 1986 |
| Priority date | — |
| Expiry date | Feb 24, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R23/163
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A spectrum analyzer for analyzing electromagnetic radiation which may be utilized to determine the radiation wavelength and power. The analyzer includes a gas filled chamber which has a collimating lens through which radiation is injected, and a reflective plate that reflects the radiation back toward the lens. A standing wave is created within the chamber having spatially periodic peaks. The chamber gas pressure is regulated to a pressure such that gas breakdown occurs, thereby generating a light pattern at each standing wave peak. The patterns are then photographed, and the patterns' diameters and spacing are measured from the resulting photograph. From the spacing and diameter obtained, wavelength and power may be calculated.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.