Patent · US Expired

Stress insensitive integrated circuit

US4599634A · kind A · utility

11Cited by
7References
15Claims
0Family size

Assignee

Inventors

Key dates

Filing dateAug 15, 1978
Grant dateJul 8, 1986
Priority date
Expiry dateAug 15, 1998

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10N39/00

Abstract

An integrated circuit includes a plurality of circuit elements interconnected to operate as a circuit and formed in a common semiconductor substrate. The substrate is mounted on a supporting package, resulting in a mechanical stress in the substrate which is symmetrical about at least one given axis. At least the circuit elements with operating characteristics which are altered by the mechanical stress and which have a critical matching or ratio relationship are arranged symmetrically about the stress axis of symmetry. In a preferred form, the integrated circuit is a linear circuit, such as an operational amplifier employing junction field effect transistors (JFETs) for its input stage and bipolar transistors for its amplifier stage. Providing device symmetry about an axis of mechanical stress symmetry enables shifts in input offset voltage for such operational amplifiers to be reduced up to a factor of about 10.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.