X-ray diagnostic apparatus
US4599742A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Feb 17, 1984 |
| Grant date | Jul 8, 1986 |
| Priority date | — |
| Expiry date | Feb 17, 2004 |
Classification
- Technology area (CPC Y)Emerging Cross-Sectional Technologies
- CPC primaryY10S378/901
- WIPO fieldAudio-visual technology
- WIPO sectorElectrical engineering
Abstract
An X-ray diagnostic apparatus comprises an X-ray radiation source for generating an X-ray and projecting the same toward an object, an X-ray detector for detecting the X-ray which has transmitted through the object to derive a total X-ray intensity distribution signal of the object including a primary X-ray signal component and a scattered X-ray signal component caused by scattered X-rays and system structural factors, a signal processor which processes the X-ray intensity distribution signal detected from the X-ray detector in such a manner that a scattered X-ray intensity distribution which is pre-calculated based upon the X-ray intensity distribution signal is eliminated from an X-ray intensity distribution obtained from the X-ray intensity distribution signal so as to derive a distribution function of the primary X-ray signal component without adverse influences on the scattered X-ray signal component, and a monitor for displaying a distribution form based upon the distribution function of the primary X-ray signal component.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.