Strain gauge measuring system
US4606231A · kind A · utility
2Cited by
5References
24Claims
0Family size
Assignee
Inventor
Key dates
| Filing date | Mar 6, 1985 |
| Grant date | Aug 19, 1986 |
| Priority date | — |
| Expiry date | Mar 6, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01D5/16
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
In the disclosed measuring system, the strain in opposingly stressed strain gauges is measured by alternately driving currents through the gauges, and measuring the resulting differences in the alternate currents. Two reversely poled transistors, or two FETs, form low impedance switches that alternately drive the currents through the gauges. A constant current source or a resistor provides a current path to both gauges.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.