Patent · US Expired

Assembly for concurrent thermogravimetry and differential thermal analysis

US4606649A · kind A · utility

16Cited by
8References
2Claims
0Family size

Assignee

Inventor

Key dates

Filing dateJan 14, 1985
Grant dateAug 19, 1986
Priority date
Expiry dateJan 14, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG01N25/4866
  • WIPO fieldMeasurement
  • WIPO sectorInstruments

Abstract

A modification to thermogravimetric analyzers with data acquisition devised to allow concurrent TG (thermogravimetry) and DTA (differential thermal analysis) measurements employs three samples mounted close to each other in a TG furnace. Two of the samples are active ones, i.e. of the material to be analyzed, and the third is a reference sample of an inert material. The first active sample is suspended from the beam of a thermobalance. The change in weight of this sample is recorded and plotted versus the temperature of the second active sample. The sample thermocouple and another identical thermocouple are placed in contact with crucibles containing the second active sample and the reference material, respectively. The differential temperature between the sample and the reference material is taken from the two identical thermocouples. The differential signal is amplified and plotted against the temperature of the second active sample. The two active samples are substantially identical to each other in geometry, i.e. amount and shape.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.