Method of emphasizing a subject area in a scanning microscope
US4611119A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Aug 4, 1983 |
| Grant date | Sep 9, 1986 |
| Priority date | — |
| Expiry date | Aug 4, 2003 |
Classification
- Technology area (CPC B)Performing Operations; Transporting
- CPC primaryB82Y15/00
- WIPO fieldElectrical machinery, apparatus, energy
- WIPO sectorElectrical engineering
Abstract
A method for emphasizing a portion of an area of a subject being scanned by a scanning microscope wherein a subject is scanned with a particle probe of the microscope moving at a given scanning speed along a line with a given space between lines and wherein the image is reproduced on the image recording device having a given scanning speed along each image line and a given spacing between the image lines characterized by enlarging selected portions of the image by selectively varying the scanning speed and spacing between the lines of at least one of the particle probe and image recording devices. The method enables producing an enlarged portion of an area of the subject being observed with the surrounding portions of the area being simultaneously produced to enable a significantly faster and more reliable discovery of the portion of the area of the subject which is of interest.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.