Patent · US Expired

Method and apparatus for automatic quantitative measurement of textures by image analysis

US4617682A · kind A · utility

22Cited by
3References
22Claims
0Family size

Assignees

Inventors

Key dates

Filing dateMar 25, 1985
Grant dateOct 14, 1986
Priority date
Expiry dateMar 25, 2005

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG06T2207/20021
  • WIPO fieldComputer technology
  • WIPO sectorElectrical engineering

Abstract

A method and an apparatus for automatic quantitative measurement of textures by image analysis for measuring textures of a material containing various optically anisotropic textures. An image of the material is divided into a plurality of sections and brightness of each section is classified into a plurality of stages to be stored as gray levels of the sections or pixels. Image patterns of the textures are recognized on the basis of gray level variations observed before and after a mask movement, and the textures of the material are determined according to predetermined criteria.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.