Method and apparatus for automatic quantitative measurement of textures by image analysis
US4617682A · kind A · utility
Assignees
Inventors
Key dates
| Filing date | Mar 25, 1985 |
| Grant date | Oct 14, 1986 |
| Priority date | — |
| Expiry date | Mar 25, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG06T2207/20021
- WIPO fieldComputer technology
- WIPO sectorElectrical engineering
Abstract
A method and an apparatus for automatic quantitative measurement of textures by image analysis for measuring textures of a material containing various optically anisotropic textures. An image of the material is divided into a plurality of sections and brightness of each section is classified into a plurality of stages to be stored as gray levels of the sections or pixels. Image patterns of the textures are recognized on the basis of gray level variations observed before and after a mask movement, and the textures of the material are determined according to predetermined criteria.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.