Patent · US Expired

Multiple quantum-well infrared detector

US4620214A · kind A · utility

26Cited by
8References
2Claims
0Family size

Assignee

Inventors

Key dates

Filing dateDec 2, 1983
Grant dateOct 28, 1986
Priority date
Expiry dateDec 2, 2003

Classification

  • Technology area (CPC H)Electricity
  • CPC primaryH10F77/146
  • WIPO fieldMicro-structural and nano-technology
  • WIPO sectorChemistry

Abstract

Alternating layers of N+ GaAs (80 .ANG.) and N+ Ga.sub.1-x Al.sub.x As (300 .ANG.), all heavily doped with a uniform flux of Sn, and biased by 2V, provide a multiple quantum-well heterojunction structure for infrared detection with cutoff wavelength established by the choice of the value x which defines the depth of the wells. Fine tuning of the cutoff wavelength may be achieved by varying the bias voltage. By biasing the individual quantum-well layers progressively through a voltage divider, an avalanche mechanism may be achieved in the detector for signal amplification. The detectors may be fabricated in large two-dimensional arrays.

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.