Event scanning
US4623797A · kind A · utility
6Cited by
14References
39Claims
0Family size
Assignee
Inventors
Key dates
| Filing date | Jun 27, 1983 |
| Grant date | Nov 18, 1986 |
| Priority date | — |
| Expiry date | Jun 27, 2003 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01B11/00
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A scanning laser beam is directed in a circular scanning pattern, perpendicular to the surface of a part that moves across the scan pattern. Reflected light received solely from part edges or other surface discontinuities is compared with a number of preselected threshold levels. When reflection intensity attains any one of the selected threshold levels, an event is triggered, and the beam position at the time of the event, together with the intensity level triggering the event, are recorded, so as to provide information limited to the part edges and other surface discontinuities.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.