Vacuum actuated bi-level test fixture
US4625164A · kind A · utility
Assignee
Inventors
Key dates
| Filing date | Mar 5, 1984 |
| Grant date | Nov 25, 1986 |
| Priority date | — |
| Expiry date | Mar 5, 2004 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07321
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
A test fixture for selectively electrically connecting an electronic circuit device for in-circuit and functional testing by automatic testing equipment. First and second pluralities of spring-loaded probes are fastened to the test fixture for respectively providing an in-circuit contact array on a first level and a functional contact array on a second level. An electronic cicuit device receiving face is mounted to the test fixture for movement to the first level for electrically connecting the electronic circuit device to the in-circuit contact array, and for movement to the second level for electrically connecting the electronic circuit device to the functional contact array. Means including a bi-level vacuum controller are disclosed for selectively moving the electronic circuit device receiving face to the first and second levels. Means coupled to the bi-level vacuum controller are disclosed for venting the test fixture to ambient during transitions from higher to lower vacuum pressures and to the unactuated condition. The bi-level vacuum controller may be locally actuated by a system operator or remotely actuated by the automatic testing equipment.
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.