Patent · US Expired

Coin testing apparatus

US4625851A · kind A · utility

39Cited by
8References
18Claims
0Family size

Assignee

Inventors

Key dates

Filing dateJul 30, 1984
Grant dateDec 2, 1986
Priority date
Expiry dateJul 30, 2004

Classification

  • Technology area (CPC G)Physics
  • CPC primaryG07F1/044
  • WIPO fieldControl
  • WIPO sectorInstruments

Abstract

A coin testing apparatus subjects a coin inserted into a coin entry (1) and rolling down an inclined track (2) to testing at a testing station (3) comprising sensors (4,5,6) which may for example be inductive sensors. If a coin is found to be acceptable an accept signal is generated and this causes gate mechanism (8) to open to permit the coin to access accept path (9), the gate mechanism (8) being normally closed so that unacceptable coins can only access a reject path (10). A post-gate detector (11) in the accept path (9) senses the passage of an accepted coin and serves to close the gate mechanism (8) and also to determine allocation of a customer credit. A pre-gate detector (12) upstream of the gate mechanism (8) has its output logically processed with the accept signal produced when an acceptable coin is tested and/or with the output of the post-gate detector (11).

Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.