Spring-stops for a bi-level test fixture
US4626779A · kind A · utility
Assignee
Inventor
Key dates
| Filing date | Mar 19, 1985 |
| Grant date | Dec 2, 1986 |
| Priority date | — |
| Expiry date | Mar 19, 2005 |
Classification
- Technology area (CPC G)Physics
- CPC primaryG01R1/07364
- WIPO fieldMeasurement
- WIPO sectorInstruments
Abstract
Improved spring-stops for a bi-level test fixture of the type that includes an electronic circuit device receiving face moveable between in-circuit and functional testing levels of a probe support plate are disclosed. A spring-loaded plate is provided below the probe support plate, and a plurality of elongated rods that extend between the electronic circuit device receiving face and the spring-loaded plate are provided for transferring the resilient force of the spring-loaded plate to the electronic circuit device receiving face. The transferred resilient force opposes the force exerted on the electronic circuit device receiving face from either operator or automatic testing equipment selectable vacuum levels such that the electronic circuit device receiving face moves to a selected one of the incircuit and functional testing levels. The rods are individually friction-fit for reciprocating motion in a low coefficient of friction and low compressive strength bushing. Each bushing is friction-fit into a corresponding opening provided therefor in the probe support plate. The low compressive strength and low coefficient of friction material of the bushings normalizes reciprocating rod …
Source: USPTO / EPO open patent data. Objective bibliographic and citation counts.